List of Tables

• XRCF Data Collection Phases Involving ACIS  
• Conversion table from CCD_ID to ACIS array location.  
• Staggered Mode Size and Timing for 2C Data
• Some ACIS CCD Characteristics (MIT Lincoln Laboratory CCID17)
• Parameters for ``Slab and Stop'' Model of CCD Gate Structure
• ACIS CCD Response Function Measurement Summary
• XRCF Phase I ACIS Science Run Descriptions
• Energy Scale for ACIS Flight Devices
• Average FWHM (eV) for Front Illuminated Devices
• FWHM (eV) for Back Illuminated Devices
• Average Front Illuminated Devices FWHM₀ and $Fano \times w$
• HEXS targets, energies, and x-ray penetration depths.
• Pileup measurement configurations.
• Example of pileup correction factors for typical detection fluxes in w215c2r
• Summary of Mesh Measurements
• Information from Simultaneous Fitting to all Five HEXS Data Sets
• Summary of Adjustments to rspgen required for BESSY data
• CCD Model Parameters for BESSY absolute measurements
• Summary of synchrotron measurements made with PTB beamlines at BESSY.
• CCD model parameter fit results from synchrotron radiation measurements
• Average counting rate for w103c4
• Depletion Depth Estimated from 5.9 keV branching ratio
• Event Position Comparison
• TRW IDs for absolute efficiency
• Estimated High Speed Tap Flux
• High Speed Tap Based Quantum Efficiencies Relative to the s2 Detector
• ACIS Count Rate Divided by SSD 5 Count Rate
• Pileup correction factors
• Spatially Averaged Relative Detection Efficiency at CSR
• Spatially Averaged Relative Detection Efficiency at CSR--Referenced to w190c3
• Mean Relative Detection Efficiencies for FI and BI CCDs at CSR--Referenced to w190c3
• Spatially Averaged Relative Detection Efficiency at CSR--Referenced to S2
• Spatially Averaged Relative Detection Efficiency from XRCF Telemetry--Referenced to S2
• Fractional Difference between Relative Detection Efficiencies at CSR and XRCF--Referenced to S2
• Comparison of relative QE measured directly and calculated from the results of depletion depth measurement
• Mean gains for ACIS at different operating temperatures
• Gain dependence on chip temperature and DEA temperature
• Background Rejection Efficiencies Measured at XRCF
• Energies surveyed and monochromator crystal elements used
• Parameter Values for ACIS-I & S Transmission Functions
• A comparison of SRC and Luxel filter thickness estimates
• Pixel numbering for grade subarrays
• Grade definitions and subpixel positions of probability maxima  
• Results of subpixel position testing using a PSF-convolved point source  
• ACIS Grade Description