Next: Data Processing
Up: Energy Scale and Spectral
Previous: Purpose
XRCF phase I was performed with the ACIS flight instrument, but without the
High Resolution Mirror Assembly
or the gratings. The full ACIS focal plane was illuminated with X-rays from
either the Electron-Impact Point Source or the Double Crystal Monochrometer.
During XRCF phase I, the detector electronics temperature was C and
the focal plane temperature was C.
ACIS was run in the full frame timed exposure mode, with a 3.34 second exposure
time. During most science runs, six of the CCDs were read out simultaneously.
A single science run included a number of TRW IDs, and in a
few cases multiple energies as well. Subarrays of various sizes were used to avoid telemetry saturation.
Table 4.4 describes each of the science runs used in this section.
Science Run | Source | Energy (eV) | FI Window (rows) | BI Window (rows) | CCDs | TRW IDs |
69 | EIPS O-K | 525 | 500 | 156 | s0 s2 s4-5 | |
70 | EIPS O-K | 525 | 250 | 78 | s0-5 | I-IAS-EA-2.001 - 2.006 |
71 | EIPS O-K | 525 | 250 | 78 | i0-3 s2-3 | I-IAI-EA-1.001 - 1.004 |
72 | EIPS Si-K | 1740 | 56 | 50 | s0 s2 s4-5 | I-IAS-EA-2.013 - 2.018 |
75 | EIPS Si-K | 1740 | 56 | 50 | i0-3 s2 | I-IAI-EA-1.009 - 1.012 |
77 | EIPS Fe-K | 6399 | 46 | 46 | i0-3 s3 | |
78 | EIPS Fe-K | 6399 | 46 | 46 | i0-1 i3 s3 | I-IAI-EA-1.025 - 1.028 |
83 | EIPS Fe-K | 6399 | 46 | 46 | i0-2 s2-3 | I-IAI-EA-1.028 |
84 | EIPS Fe-K | 6399 | 46 | 46 | s0-5 | I-IAS-EA-2.037 - 2.042 |
91 | EIPS Cu-K | 8040 | 30 | 30 | i0-3 s2-3 | I-BND-BU-2.004 |
92 | EIPS Cu-K | 8040 | 20 | 30 | i0-3 s2-3 | I-IAI-EA-1.029 - 1.032 |
93 | EIPS Cu-K | 8040 | 20 | 30 | s0-5 | I-IAS-EA-2.043 - 2.048 |
96 | EIPS C-K | 277 | 1024 | 512 | s0-5 | I-BND-BU-2.037 |
97 | EIPS C-K | 277 | 512 | 1024 | s0-5 | I-IAS-EA-2.049 - 2.050 |
100 | EIPS Ti-K | 4509 | 28 | 24 | s0-5 | I-IAS-EA-2.032, 2.034 |
104 | EIPS Ti-K | 4509 | 28 | 24 | i0-3 s2-3 | I-IAI-EA-1.024 |
111 | EIPS Al-K | 1487 | 24 | 20 | s0-5 | I-IAS-EA-2.029 - 2.031 |
112 | EIPS Al-K | 1487 | 24 | 20 | i0-3 s2-3 | I-IAI-EA-1.017 - 1.020 |
114 | EIPS Si-K | 1740 | 28 | 26 | i0-3 s2 | I-IAI-EA-5.003 - 5.004 |
115 | EIPS O-K | 525 | 250 | 78 | i0-3 s2-3 | I-IAI-EA-5.001 - 5.002 |
116 | EIPS O-K | 525 | 250 | 78 | s0-5 | I-IAS-EA-2.101 - 2.106 |
117 | EIPS O-K | 525 | 250 | 78 | i0-3 s2-3 | I-IAI-EA-1.101 - 1.104 |
120 | EIPS Ti-K | 4509 | 28 | 24 | s0-5 | I-IAS-EA-2.131 - 2.132, 2.134 |
122 | EIPS Ti-K | 4509 | 28 | 24 | s0-5 | I-IAS-EA-2.133, 2.135 - 2.136 |
123 | EIPS Ti-K | 4509 | 28 | 24 | i0-3 s2-3 | I-IAI-EA-1.121 - 1.124 |
128 | DCM | 1380 | 1024 | 1024 | i3 s1 s3 | I-IAI-EA-1.204 - 1.206 |
131 | DCM | 1770 | 512 | 512 | i3 s1 s3 | I-IAI-EA-1.213 - 1.215 |
132 | DCM | 4500 | 1024 | 1024 | i3 s1 s3 | I-IAI-EA-1.222 - 1.224 |
149 | DCM | 2035 | 1024 | 1024 | i0-3 s2-3 | I-IAI-EA-1.225 |
Mark Bautz