ACIS Internal Memo 161-180
PS 161 (08/18/99) MJP
- ACIS Gain during OAC
PS 162 (09/01/99) FKB
- ACIS On-orbit Background Rates and Spectra from OAC Phase 1
PS 163 (09/13/99) GYP
- Measurement of the CTI of the Chandra CCDs
PS 164 (09/13/99) CEG
- Gain Change in ACIS CCDs during OAC Phase 2
PS 165 (original 09/15/99, updated monthly) BL
- ACIS Diagnostic Test Obsid List
PS 166 (09/15/99) BL
- S3 On-orbit calibration Source Peak Locations
PS 167 (09/19/99) MJP
- Dark Current Measurement
PS 168 (09/19/99) CEG
- Temperature Dependence of CTI for S2 and S3
PS 169 (09/20/99) CEG
- Time History of CTI for S2 and S3
PS 170 (09/20/99) MJP
- Hot Pixels at -60 C
PS 171 (09/29/99) BL
- ACIS Flight Gain and Resolution as a function of Row
PS 172 (10/04/99) GYP
- Deterioration of charge transfer in the center of the FI CCDs
PS 173 (10/13/99) CEG
- Longer Term Stability of ACIS CTI
PS 174 (10/13/99) CEG
- Variation of CTI across the ACIS focal plane
PS 175 (10/20/99) BL
- Limits of S3 Damage Due to Radiation Belt Passes at the HRMA Focus
PS 176 (11/08/99) GYP
- Time constants of electron traps in the CCD channel. Part 1: Fast emission time constant
PS 177 (12/03/99) CEG
- Time constants of electron traps in the CCD channel. Part 2: Sacrificial charge analysis
PS 178 (12/15/99) GYP
- Time constants of electron traps in the CCD channel. Part 3: Fast emission time constant, temperature dependence
PS 179 (01/06/00) GYP
- Time constants of electron traps in the CCD channel. Part 3, an update
PS 180 (01/06/00) BL
- Measured CTI vs Detected ACIS Counts During External Calibration Source Data Sets
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