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The most important off-peak features of the CCD response function
are the silicon escape and
fluorescence peaks that emerge when the energy of incoming
irradiation exceeds the silicon absorption edge energy.
The intensity of those peaks is a function of energy, and hence
the ideal way to experimentally characterize these features is to illuminate
the CCD with a monochromatic beam and collect data at different
energies. This has been done at the synchrotron storage ring
at BESSY using the Crystal
Monochromator Beamline (KMC). The CCD which was tested there was w102c3.
Data appropriate for fluorescence analysis were taken at
energies ranging from 2 to 6 keV at an operating temperature of -120 C.
After obtaining a histogram of
the standard combination of grades at each energy a single gaussian
fit was made for
each of three peaks: main peak, escape and fluorescence.
The number of counts for both escape and fluorescence peaks normalized to
the main peak are shown in Fig 4.8 as a function of
energy.
A simulation of the CCD response for the same energies was run using
a model based on the Monte-Carlo method.
For each energy point 1,000,000 photons were thrown into the
CCD structure, the simulated histograms were then treated in exactly the
same way as experimental data.
The model predictions
are shown in the same Figure as solid lines.
Figure 4.8:
Intensities of experimentally measured escape (*) and fluorescence
(+) features as a function of energy.
Solid lines are the model predictions.
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For the escape peak the agreement between model and experiment is excellent.
For the fluorescence peak it is reasonable, although there is an
obvious discrepancy indicating
that the model introduces some systematic error. The reason for that
will be investigated later. This error does not have any practical
significance, taking into account the very low number of
counts in the fluorescence peak
Next: Pileup Measurements and Modelling
Up: Energy Scale and Spectral
Previous: Results
Mark Bautz
11/20/1997