Dom v ko (06/17/94)
Measurement of the Channel Potential of the CCID-10
ACIS memo # 41 (06/17/94)
Measurement of the Channel Potential of the CCID-10
ACIS memo # 42 (06/22/94)
Measurement of the Depletion Depth of the CCID-10
ACIS memo # 44 (06/11/94)
More on the Channel Potential and the Depletion Depth
ACIS memo # 69 (05/04/95)
Some HIREFS results
ACIS memo # 82 (09/11/95)
Notes on the Bias Frame Pixel Statistics of the L-box Controlled CCD
ACIS memo # 91 (10/16/95)
Backside Illuminated Chip in the HIREFS Chamber
ACIS memo # 96 (11/29/95)
CCD Gain Stability
ACIS memo # 97 (12/19/95)
CCD Gain Stability, Frontside Illuminated Device
ACIS memo # 126 (12/31/96)
Transmission of SiO2 and Si3N4 Films
ACIS memo # 133 (06/03/97)
Much More on the Transmission of SiO2 and Si3N4 Films
ACIS memo # 146 (08/05/97)
Branching ratio technique for the depletion depth measurement
ACIS memo # 150 (01/20/98)
X-ray detection in channel stops
No number (09/10/98)
Charge loss in the channel stop regions of the CCD and implications for backside illuminated devices
ACIS memo # 157 (10/27/98)
How to measure gate thicknesses in a CCD pixel.
ACIS memo # 163 (09/13/99)
Measurement of the CTI of the Chandra CCD.
ACIS memo # 164 (the number is wrong) (09/17/99)
Measurement of the CTI of the Chandra CCD, an update.
ACIS memo # 172 (10/04/99)
Deterioration of charge transfer in the center of the FI CCDs
ACIS memo # 176 (11/08/99)
Time constants of electron traps in the CCD channel. Part 1: Fast emission time constant.
ACIS memo # 178 (12/15/99)
Time constants of electron traps in the CCD channel. Part 3: Fast emission time constant, temperature dependence.
ACIS memo # 179 (01/06/00)
Time constants of electron traps in the CCD channel. Part 3: an update.
ACIS memo # 187 (05/26/00)
Squeegee mode: bias stability, trap time constants and related stuff.
ACIS memo # 189 (06/28/00)
Squeegee bias on I0, S0, and w459c1.
ASTRO-E2 memo, (09/01/2004)
Dark current blobs on ASTRO-E2 BI CCD.