Figure vsg.4 : First-order Diffraction Efficiency Trends.
lines represent the efficiency derived from the first X-GEF test
carried out on the facet, representative of the flight-grating X-GEF
changes in measured diffraction efficiency for subsequent tests
are shown; the dotted lines represent
efficiency variations of +/- 10% of the initial value.
Some facet measurements of note are indicated with the grating name.
See the HEG and MEG First-order Efficiency Plot Anomalies sections
of the text for
a list and discussion of anomalies in these trend plots.