This page is http://space.mit.edu/HETG/ia/perform_4.html 1998-12-06

Grating Spectrometer Performance Tests:

System-level Testing at XRCF

Resolving Power

Grating Period
w/HXDS
PSF and LRF
w/HXDS
PSF and LRF
w/Flight Detector
Other PSF Tests
HETG : Beam Center Test: FPC pin hole scan of diffracted orders, Al-K, Mg-K Al-K, Mg-K images w/HSI; Mg-K slit scans Verify Rowland geometry with quadrant shutter focus images, Al-K, Si-K HEG scatter w/'2C and ACIS-S;
MEG mis-aligned
gratings w/HSI images
LETG : Beam Center Test above plus: Penning 130 A images, Ti-K images Penning 130 and 160 A; Mg-K orders Plate scale w/HRC-S; Scatter w/ACIS-S

Effective Area

Grating Efficiency
w/HXDS
Absolute Area
w/Flight Detector
Eff. Area Features
vs Energy
Other Effic. Tests
HETG : Grating In/Out Tests using FPC w/apertures ACIS-S with DCM Continuum spectra of C and Cu w/ACIS-S High-order effic.s
LETG : Grating In/Out Tests using FPC w/apertures Relative effic.s (HRC modified post-XRCF) Continuum spectra of C and Cu w/ACIS-S Support structure and high-order effic.s



HETG Calibration: http://space.mit.edu/HETG/xrcf.html perf-4, -->